Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing. - Mustapha Slamani; Bozena Kaminska (IEEE Des. Test Comput., 1992)

An Integrated Approach for Analog Ciruit Testing with a Minmum Number of Detected Parameters. - Mustapha Slamani; Bozena Kaminska; Guy Quesnel (ITC, 1994)

Multifrequency testability analysis for analog circuits. - Mustapha Slamani; Bozena Kaminska (VTS, 1994)

Multifrequency Analysis of Faults in Analog Circuits. - Mustapha Slamani; Bozena Kaminska (IEEE Des. Test Comput., 1995)

A DSP testing approach by modeling the circuit response as a Markov chain. - Mustapha Slamani; Maddi Zineb; Mounir Boukadoum (ICECS, 1998)

Impedance Mismatch and Lumped Capacitance Effects in High Frequency Testing. - Iboun Taimiya Sylla; Mustapha Slamani; Bozena Kaminska; Fartoumi M. Hossein; Patrick Vincent (VTS, 1998)

New circuit techniques based on a high performance frequency-to-voltage converter. - Abdelohahab Djemouai; Mohamad Sawan; Mustapha Slamani (ICECS, 1999)

A 200 MHz frequency-locked loop based on new frequency-to-voltage converters approach. - Abdelohahab Djemouai; Mohamad Sawan; Mustapha Slamani (ISCAS (2), 1999)

An efficient RF power transfer and bidirectional data transmission to implantable electronic devices. - Abdelohahab Djemouai; Mohamad Sawan; Mustapha Slamani (ISCAS (2), 1999)

New CMOS integrated pulse width modulator for voltage conversion applications. - Abdelohahab Djemouai; Mohamad Sawan; Mustapha Slamani (ICECS, 2000)

A preamplifier IC design for photonic links. - André Boyoguéno; Bozena Kaminska; Mustapha Slamani (ISCAS, 2000)

Reducing Test Time in the High-Volume Production of Analog Circuits using Efficient Test-Vector Generation and Interpolation Techniques. - Mustapha Slamani; Karim Arabi (J. Electron. Test., 2001)

A Unity Gain High Speed Buffer to Improve Signal Integrity in High Frequency Test Interface. - Iboun Taimiya Sylla; Mustapha Slamani; Bozena Kaminska (J. Electron. Test., 2001)

Testing Highly Integrated Wireless Circuits and Systems with Low Cost Tester: How to Overcome the Challenge? - Mustapha Slamani (ITC, 2002)

Wireless Test. - Robert C. Aitken; Mustapha Slamani; H. Ding; William R. Eisenstadt; Sanghoon Choi; John McLaughlin (VTS, 2002)

RF Test 101: Defining the Problem, Finding Solutions. - Mustapha Slamani (ITC, 2003)

A low-cost test solution for wireless phone RFICs. - John Ferrario; Randy Wolf; Steve Moss; Mustapha Slamani (IEEE Commun. Mag., 2003)

ITC 2003 panels: Part 2. - Carol Stolicny; Mustapha Slamani; Fidel Muradali; Geir Eide; Mike Li (IEEE Des. Test Comput., 2004)

Reducing high-speed/RF test cost - guaranteed by design or guaranteed to fail? - Mustapha Slamani (ITC, 2005)

A BICMOS 120 MW 11 GHZ transimpedance amplifier Dedicated for High-Speed Photoreceivers. - André Boyoguéno; Mohamad Sawan; Mustapha Slamani (J. Circuits Syst. Comput., 2006)

Non-RF to RF Test Correlation Using Learning Machines: A Case Study. - Haralampos-G. D. Stratigopoulos; Petros Drineas; Mustapha Slamani; Yiorgos Makris (VTS, 2007)

RF Testing on a Mixed Signal Tester. - Dana Brown; John Ferrario; Randy Wolf; Jing Li; Jayendra Bhagat; Mustapha Slamani (J. Electron. Test., 2007)

Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction. - Nathan Kupp; Petros Drineas; Mustapha Slamani; Yiorgos Makris (ETS, 2008)

On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction. - Nathan Kupp; Petros Drineas; Mustapha Slamani; Yiorgos Makris (J. Electron. Test., 2009)

Synthetic DSP approach for novel FPGA-based measurement of error vector magnitude. - Devin Morris; William R. Eisenstadt; Andrea Paganini; Mustapha Slamani; Timothy Platt; John Ferrario (ITC, 2010)

RF Specification Test Compaction Using Learning Machines. - Haralampos-G. D. Stratigopoulos; Petros Drineas; Mustapha Slamani; Yiorgos Makris (IEEE Trans. Very Large Scale Integr. Syst., 2010)

Correlating inline data with final test outcomes in analog/RF devices. - Nathan Kupp; Mustapha Slamani; Yiorgos Makris (DATE, 2011)

Extraction of EVM from Transmitter System Parameters. - Afsaneh Nassery; Sule Ozev; Marian Verhelst; Mustapha Slamani (ETS, 2011)

Analog/RF test ordering in the early stages of production testing. - Nourredine Akkouche; Salvador Mir; Emmanuel Simeu; Mustapha Slamani (VTS, 2012)

Built-in-Self Test of transmitter I/Q mismatch using self-mixing envelope detector. - Afsaneh Nassery; Srinath Byregowda; Sule Ozev; Marian Verhelst; Mustapha Slamani (VTS, 2012)

Analytical modeling for EVM in OFDM transmitters including the effects of IIP3, I/Q imbalance, noise, AM/AM and AM/PM distortion. - Afsaneh Nassery; Sule Ozev; Mustapha Slamani (ETS, 2013)

Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM Technique. - Tian Xia 005; Rohit Shetty; Timothy Platt; Mustapha Slamani (J. Electron. Test., 2013)

Built-in self-test and characterization of polar transmitter parameters in the loop-back mode. - Jae Woong Jeong; Sule Ozev; Shreyas Sen; Vishwanath Natarajan; Mustapha Slamani (DATE, 2014)

Continuous wave radar circuitry testing using OFDM technique. - Mohamed Metwally; Nicholai L'Esperance; Tian Xia 005; Mustapha Slamani (VTS, 2014)

Built-In Self-Test of Transmitter I/Q Mismatch and Nonlinearity Using Self-Mixing Envelope Detector. - Afsaneh Nassery; Srinath Byregowda; Sule Ozev; Marian Verhelst; Mustapha Slamani (IEEE Trans. Very Large Scale Integr. Syst., 2015)

OFDM Multitone Signal Generation Technique for Analog Circuitry Test Characterization. - Nicholai L'Esperance; Timothy Platt; Mustapha Slamani; Tian Xia 005 (IEEE Trans. Circuits Syst. II Express Briefs, 2016)

Signal Integrity Analysis and Optimization of DDR Interconnect Design. - Xiaozhe Fan; Swathi Manamohan; Mustapha Slamani; John Ferrario; Murugan Muthukaruppan (ICCE, 2024)

A Modular IQ Baseband Digitizer for Post-Fabrication Testing. - Xiaozhe Fan; Manoj Bhadra Reddy; Mustapha Slamani; John Ferrario; S. R. Jino Ramson; Li Song (ICCE, 2025)