Phonon-Drag Contribution to Seebeck Coefficient in P-Type Si, Ge and Si1-xGex. - Veerappan Manimuthu; Muthusamy Omprakash; Mukannan Arivanandhan; Faiz Salleh; Yasuhiro Hayakawa; Hiroya Ikeda (IEICE Trans. Electron., 2017)