Automated Co-Optimization Framework of Feature Selection and Ensemble Learning for Wafer Yield Prediction. - Tianming Ni; Hao Wu; Muyang Cheng; Jingchang Bian; Senling Wang; Xiaoqing Wen; Mu Nie (IEEE Trans Autom. Sci. Eng., 2026)

Dynamic Meta-Learning with Attentional Prototypes for Few-Shot Wafer Defect Recognition. - Tianming Ni; Meifang Yu; Xiaofei Chen; Huaguo Liang; Senling Wang; Muyang Cheng; Mu Nie (J. Electron. Test., 2026)