Highly Reliable 28nm Embedded Flash Process Development for High-Density and High-Speed Automotive Grade-1 Application. - Jaehun Lee; Youngcheon Jeong; Kyongsik Yeom; Changmin Jeon; Jongsung Woo; Sangjin Lee; Ga-Young Lee; Dong-Hwee Hwang; Yong Seok Chung; Minji Seo; Dong-Hyun Kim; DalHwan Kim; et al. (IMW, 2021)