Challenges and limitations of NAND flash memory devices based on floating gates. - Byoungjun Park; Sunghoon Cho; Milim Park; Sukkwang Park; Yunbong Lee; Myoungkwan Cho; Kunok Ahn; Gihyun Bae; Sungwook Park (ISCAS, 2012)

Novel integration technologies for improving reliability in NAND flash memory. - Hyunyoung Shim; Myoungkwan Cho; Kunok Ahn; Gihyun Bae; Sungwook Park (ISCAS, 2012)

RTS noise reduction of 1Y-nm floating gate NAND flash memory using process optimization. - Sungho Kim; Myeongwon Lee; Gil-Bok Choi; Jaekwan Lee; Yunbong Lee; Myoungkwan Cho; Kunok Ahn; Jinwoong Kim (IRPS, 2015)