A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture. - Youbean Kim; Myung-Hoon Yang; Yong Lee 002; Sungho Kang 001 (Asian Test Symposium, 2005)

An Effective Test Pattern Generation for Testing Signal Integrity. - YongJoon Kim; Myung-Hoon Yang; Youngkyu Park; Daeyeal Lee; Sungho Kang 001 (ATS, 2006)

Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing. - Myung-Hoon Yang; Youbean Kim; Youngkyu Park; D. Lee; Sungho Kang 001 (IET Comput. Digit. Tech., 2007)

XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults. - Sunghoon Chun; YongJoon Kim; Taejin Kim; Myung-Hoon Yang; Sungho Kang 001 (ATS, 2008)

An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based Scheme. - Taejin Kim; Sunghoon Chun; YongJoon Kim; Myung-Hoon Yang; Sungho Kang 001 (ATS, 2008)

An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR. - Myung-Hoon Yang; YongJoon Kim; Sunghoon Chun; Sungho Kang 001 (J. Electron. Test., 2008)

Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time. - YongJoon Kim; Myung-Hoon Yang; Jaeseok Park; Eunsei Park; Sungho Kang 001 (IEICE Trans. Inf. Syst., 2009)

EOF: Efficient Built-In Redundancy Analysis Methodology With Optimal Repair Rate. - Myung-Hoon Yang; Hyungjun Cho; Wooheon Kang; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010)