Effects of hot carriers in offset gated polysilicon thin-film transistors. - Argyrios T. Hatzopoulos; Dimitrios H. Tassis; N. Arpatzanis; C. A. Dimitriadis; G. Kamarinos (Microelectron. Reliab., 2006)

Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors. - Dimitrios H. Tassis; Argyrios T. Hatzopoulos; N. Arpatzanis; C. A. Dimitriadis; G. Kamarinos (Microelectron. Reliab., 2006)

Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors under DC electrical stress. - N. Arpatzanis; Argyrios T. Hatzopoulos; Dimitrios H. Tassis; C. A. Dimitriadis; François Templier; Maher Oudwan; G. Kamarinos (Microelectron. Reliab., 2008)

Hysteresis effect in bottom-gate polymorphous silicon thin-film transistors. - N. A. Hastas; N. Arpatzanis; C. A. Dimitriadis; Julien Brochet; François Templier; G. Kamarinos (Microelectron. Reliab., 2011)