N. G. Rudawski

According to our database1, N. G. Rudawski
  • authored at least 2 papers between 2012 and 2017.
  • has a "Dijkstra number"2 of five.

Timeline

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Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2017
Nanocrack formation in AlGaN/GaN high electron mobility transistors utilizing Ti/Al/Ni/Au ohmic contacts.
Microelectronics Reliability, 2017

2012
Under-gate defect formation in Ni-gate AlGaN/GaN high electron mobility transistors.
Microelectronics Reliability, 2012


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