Impact of the As dose in 0.35 mum EEPROM technology: characterization and modeling. - N. Galbiati; G. Ghidini; C. Cremonesi; Luca Larcher (Microelectron. Reliab., 2001)

Impact of interface and bulk trapped charges on transistor reliability. - G. Ghidini; M. Langenbuch; R. Bottini; D. Brazzelli; Andrea Ghetti; N. Galbiati; G. Giusto; A. Garavaglia (Microelectron. Reliab., 2005)