BEAM: A Computational Workflow System for Managing and Modeling Material Characterization Data in HPC Environments. - Eric J. Lingerfelt; Alex Belianinov; Eirik Endeve; O. Ovchinnikov; Suhas Somnath; Jose M. Borreguero; N. Grodowitz; B. Park; Richard K. Archibald; Christopher T. Symons; Sergei V. Kalinin; O. E. Bronson Messer; et al. (ICCS, 2016)