Effect of autoclave test on anisotropic conductive joints. - C. W. Tan; Y. C. Chan; N. H. Yeung (Microelectron. Reliab., 2003)

Behaviour of anisotropic conductive joints under mechanical loading. - C. W. Tan; Y. C. Chan; N. H. Yeung (Microelectron. Reliab., 2003)

Bias-HAST on tape ball grid array (TBGA) test pattern. - N. H. Yeung; Victor Lau; Y. C. Chan (Microelectron. Reliab., 2004)