Metrics and analyses in the test phase of large-scale software. - Eiji Obara; T. Kawasaki; Y. Ookawa; N. Maeda (J. Syst. Softw., 1997)

An Overview of SiC High-Voltage Power Devices and High-Temperature ICs. - Tsunenobu Kimoto; M. Kaneko; Keita Tachiki; K. Ito; K. Mikami; H. Fujii; A. Inoue; N. Maeda (BCICTS, 2024)