Extraction of defect density and size distributions from wafer sort test results. - Jeffrey E. Nelson; Thomas Zanon; Rao Desineni; Jason G. Brown; N. Patil; Wojciech Maly; R. D. (Shawn) Blanton (DATE, 2006)

A survey of video datasets for anomaly detection in automated surveillance. - N. Patil; Prabir Kumar Biswas (ISED, 2016)

Global abnormal events detection in surveillance video - A hierarchical approach. - N. Patil; Prabir Kumar Biswas (ISED, 2016)

Location Aware Hierarchical Cell-Based Anomaly Detection and Categorization in Crowded Scenes. - N. Patil; Prabir Kumar Biswas (ICAPR, 2017)

Video Anomaly Detection and Localization using 3D SL-HOF Descriptor. - N. Patil; Prabir Kumar Biswas (ICAPR, 2017)

Detection of global abnormal events in crowded scenes. - N. Patil; Prabir Kumar Biswas (NCC, 2017)

Global abnormal events detection in crowded scenes using context location and motion-rich spatio-temporal volumes. - N. Patil; Prabir Kumar Biswas (IET Image Process., 2018)