Experimental observation of TDDB-like behavior in reverse-biased green InGaN LEDs. - Matteo Buffolo; Matteo Meneghini; Carlo De Santi; Henry Felber; N. Renso; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2016)

Understanding the degradation processes of GaN based LEDs submitted to extremely high current density. - N. Renso; Matteo Meneghini; Matteo Buffolo; Carlo De Santi; Gaudenzio Meneghesso; Enrico Zanoni (Microelectron. Reliab., 2017)

Failure limits and electro-optical characteristics of GaN-based LEDs under electrical overstress. - N. Renso; Matteo Buffolo; Carlo De Santi; Matteo Ronzani; Gaudenzio Meneghesso; Enrico Zanoni; Matteo Meneghini (Microelectron. Reliab., 2018)