Current conduction mechanism of MIS devices using multidimensional minimization system program. - N. Rouag; Zahir Ouennoughi; Mathias Rommel; Katsuhisa Murakami; Lothar Frey (Microelectron. Reliab., 2015)

Normalized differential conductance to study current conduction mechanisms in MOS structures. - T. H. Nouibat; Zitouni Messai; D. Chikouch; Zahir Ouennoughi; N. Rouag; Mathias Rommel; Lothar Frey (Microelectron. Reliab., 2018)