B-Spline X-Ray Diffraction Imaging - Rapid non-destructive measurement of die warpage in ball grid array packages. - Aidan Cowley; Andrej Ivankovic; C. S. Wong; N. S. Bennett; A. N. Danilewsky; Marcel Gonzalez; Vladimir Cherman; Bart Vandevelde; Ingrid De Wolf; Patrick J. McNally (Microelectron. Reliab., 2016)