New Methodology for Evaluating Minority Carrier Lifetime for Process Assessment. - Kuniyuki Kakushima; Takuya Hoshii; M. Watanabe; N. Shizyo; K. Furukawa; Takuya Saraya; T. Takakura; K. Itou; M. Fukui; S. Suzuki; Ken Takeuchi; Iriya Muneta; et al. (VLSI Circuits, 2018)