Terrestrial SER characterization for nanoscale technologies: A comparative study. - Nihaar N. Mahatme; Bharat L. Bhuva; Nelson J. Gaspard; T. Assis; Y. Xu; P. Marcoux; M. Vilchis; Balaji Narasimham; A. Shih; Shi-Jie Wen; Rick Wong; N. Tam; et al. (IRPS, 2015)

Multi-cell soft errors at the 16-nm FinFET technology node. - N. Tam; Bharat L. Bhuva; Lloyd W. Massengill; Dennis R. Ball; Michael W. McCurdy; Michael L. Alles; Indranil Chatterjee (IRPS, 2015)