Superior Endurance Performance of 22-nm Embedded MRAM Technology. - Vinayak Bharat Naik; J. H. Lim; K. Yamane; Dinggui Zeng; H. Yang; N. Thiyagarajah; Jae Hyun Kwon; N. L. Chung; R. Chao; T. Ling; K. Lee (IRPS, 2019)