The time-voltage trade-off for ESD damage threshold in amorphous silicon hydrogenated thin-film transistors. - N. Tosic Golo; S. van der Wal; Fred G. Kuper; Ton J. Mouthaan (Microelectron. Reliab., 2001)

Zapping thin film transistors. - N. Tosic Golo; Fred G. Kuper; Ton J. Mouthaan (Microelectron. Reliab., 2002)