Heavy-ion irradiation study in SOI-based and bulk-based junctionless FinFETs using 3D-TCAD simulation. - N. Vinodhkumar; Y. V. Bhuvaneshwari; K. K. Nagarajan; R. Srinivasan (Microelectron. Reliab., 2015)

Phase displacement study in MOSFET based ring VCOs due to heavy-ion irradiation using 3D-TCAD and circuit simulation. - Maran Ponnambalam; N. Vinodhkumar; R. Srinivasan; Premanand Venkatesh Chandramani (Microelectron. Reliab., 2016)

SET and SEU performance of single, double, triple and quadruple-gate junctionlessFETs using numerical simulations. - N. Vinodhkumar; R. Srinivasan (Microelectron. J., 2017)

Numerical Study on SEU Performance of Strain Engineered 6T-SRAM Cells. - N. Vinodhkumar; G. Durga; S. Muthumanickam (J. Circuits Syst. Comput., 2022)