Controlling Peak Power Consumption During Scan Testing: Power-Aware DfT and Test Set Perspectives. - Nabil Badereddine; Patrick Girard 001; Arnaud Virazel; Serge Pravossoudovitch; Christian Landrault (PATMOS, 2005)

Scan Cell Reordering for Peak Power Reduction during Scan Test Cycles. - Nabil Badereddine; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Christian Landrault (VLSI-SoC, 2005)

Power-Aware Test Data Compression for Embedded IP Cores. - Nabil Badereddine; Zhanglei Wang; Patrick Girard 001; Krishnendu Chakrabarty; Serge Pravossoudovitch; Christian Landrault (ATS, 2006)

Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing. - Nabil Badereddine; Patrick Girard 001; Serge Pravossoudovitch; Christian Landrault; Arnaud Virazel; Hans-Joachim Wunderlich (VLSI-SoC, 2006)

A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction. - Nabil Badereddine; Zhanglei Wang; Patrick Girard 001; Krishnendu Chakrabarty; Arnaud Virazel; Serge Pravossoudovitch; Christian Landrault (J. Electron. Test., 2008)

A statistical simulation method for reliability analysis of SRAM core-cells. - Renan Alves Fonseca; Luigi Dilillo; Alberto Bosio; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Nabil Badereddine (DAC, 2010)

Impact of Resistive-Bridging Defects in SRAM Core-Cell. - Renan Alves Fonseca; Luigi Dilillo; Alberto Bosio; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Nabil Badereddine (DELTA, 2010)

Analysis of resistive-bridging defects in SRAM core-cells: A comparative study from 90nm down to 40nm technology nodes. - Renan Alves Fonseca; Luigi Dilillo; Alberto Bosio; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Nabil Badereddine (ETS, 2010)

Setting test conditions for improving SRAM reliability. - Renan Alves Fonseca; Luigi Dilillo; Alberto Bosio; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Nabil Badereddine (ETS, 2010)

Detecting NBTI induced failures in SRAM core-cells. - Renan Alves Fonseca; Luigi Dilillo; Alberto Bosio; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Nabil Badereddine (VTS, 2010)

Failure Analysis and Test Solutions for Low-Power SRAMs. - Leonardo Bonet Zordan; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Serge Pravossoudovitch; Aida Todri; Arnaud Virazel; Nabil Badereddine (Asian Test Symposium, 2011)

Optimized march test flow for detecting memory faults in SRAM devices under bit line coupling. - Leonardo Bonet Zordan; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Nabil Badereddine (DDECS, 2011)

On using address scrambling to implement defect tolerance in SRAMs. - Renan Alves Fonseca; Luigi Dilillo; Alberto Bosio; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Nabil Badereddine (ITC, 2011)

Defect analysis in power mode control logic of low-power SRAMs. - Leonardo Bonet Zordan; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Aida Todri; Arnaud Virazel; Nabil Badereddine (ETS, 2012)

Low-power SRAMs power mode control logic: Failure analysis and test solutions. - Leonardo Bonet Zordan; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Aida Todri; Arnaud Virazel; Nabil Badereddine (ITC, 2012)

Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes. - Renan Alves Fonseca; Luigi Dilillo; Alberto Bosio; Patrick Girard 001; Serge Pravossoudovitch; Arnaud Virazel; Nabil Badereddine (J. Electron. Test., 2012)

Adaptive Source Bias for Improved Resistive-Open Defect Coverage during SRAM Testing. - Elena I. Vatajelu; Luigi Dilillo; Alberto Bosio; Patrick Girard 001; Aida Todri; Arnaud Virazel; Nabil Badereddine (Asian Test Symposium, 2013)

Test solution for data retention faults in low-power SRAMs. - Leonardo Bonet Zordan; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Aida Todri; Arnaud Virazel; Nabil Badereddine (DATE, 2013)

Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures. - Elena I. Vatajelu; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Aida Todri; Arnaud Virazel; Nabil Badereddine (DTIS, 2013)

Analyzing resistive-open defects in SRAM core-cell under the effect of process variability. - Elena I. Vatajelu; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Aida Todri; Arnaud Virazel; Nabil Badereddine (ETS, 2013)

On the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs. - Leonardo Bonet Zordan; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Aida Todri; Arnaud Virazel; Nabil Badereddine (ITC, 2013)

A built-in scheme for testing and repairing voltage regulators of low-power srams. - Leonardo Bonet Zordan; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Aida Todri; Arnaud Virazel; Nabil Badereddine (VTS, 2013)

On the Test and Mitigation of Malfunctions in Low-Power SRAMs. - Leonardo Bonet Zordan; Alberto Bosio; Luigi Dilillo; Patrick Girard 001; Arnaud Virazel; Nabil Badereddine (J. Electron. Test., 2014)