Static Performance and Reliability of 4H-SiC Diodes with P+ Regions Formed by Various Profiles and Temperatures. - Stephen A. Mancini; Seung Yup Jang; Zeyu Chen; Dongyoung Kim; Justin Lynch; Yafei Liu; Balaji Raghothamachar; Minseok Kang; Anant Agarwal; Nadeemullah Mahadik; Robert Stahlbush; Michael Dudley; et al. (IRPS, 2022)