Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects. - Frédéric Darracq; Hervé Lapuyade; Nadine Buard; Pascal Fouillat; R. Dufayel; Thierry Carrière (Microelectron. Reliab., 2003)

A Review of DASIE Code Family: Contribution to SEU/MBU Understanding. - Guillaume Hubert; Nadine Buard; Cécile Weulersse; Thierry Carrière; Marie-Catherine Palau; Jean-Marie Palau; Damien Lambert; Jacques Baggio; Frederic Wrobel; Frédéric Saigné; Rémi Gaillard (IOLTS, 2005)

From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately? - Lorena Anghel; Michael Nicolaidis; Nadine Buard (IOLTS, 2006)

Prediction of Transient Induced by Neutron/Proton in CMOS Combinational Logic Cells. - Guillaume Hubert; Antonin Bougerol; Florent Miller; Nadine Buard; Lorena Anghel; Thierry Carrière; Frederic Wrobel; Rémi Gaillard (IOLTS, 2006)

Latchup effect in CMOS IC: a solution for crypto-processors protection against fault injection attacks? - Nadine Buard; Florent Miller; Cédric Ruby; Rémi Gaillard (IOLTS, 2007)

Multiple Event Transient Induced by Nuclear Reactions in CMOS Logic Cells. - Claudia Rusu; Antonin Bougerol; Lorena Anghel; Cécile Weulersse; Nadine Buard; S. Benhammadi; Nicolas Renaud; Guillaume Hubert; Frederic Wrobel; Thierry Carrière; Rémi Gaillard (IOLTS, 2007)

SDRAM Architecture & Single Event Effects Revealed with Laser. - Antonin Bougerol; Florent Miller; Nadine Buard (IOLTS, 2008)

Novel DRAM mitigation technique. - Antonin Bougerol; Florent Miller; Nadine Buard (IOLTS, 2009)