BIST for network on chip communication infrastructure based on combination of extended IEEE 1149.1 and IEEE 1500 standards. - Reza Nourmandi-Pour; Nafiseh Mousavian; Ahmad Khadem-Zadeh (Microelectron. J., 2011)

Testing of SoC interconnects using Extended IEEE 1500 Standard. - Nafiseh Mousavian; Reza Nourmandi-Pour; Arash Ghorbannia Delavar (J. Circuits Syst. Comput., 2012)

A fully parallel BIST-based method to test the crosstalk defects on the inter-switch links in NOC. - Reza Nourmandi-Pour; Nafiseh Mousavian (Microelectron. J., 2013)