An approach to statistical analysis of gate oxide breakdown mechanisms. - Cher Ming Tan; Nagarajan Raghavan (Microelectron. Reliab., 2007)

A framework to practical predictive maintenance modeling for multi-state systems. - Cher Ming Tan; Nagarajan Raghavan (Reliab. Eng. Syst. Saf., 2008)

Reply to comments on "A framework to practical predictive maintenance modeling for multi-state systems". - Cher Ming Tan; Nagarajan Raghavan (Reliab. Eng. Syst. Saf., 2009)

Performance and reliability trade-offs for high-κ RRAM. - Nagarajan Raghavan (Microelectron. Reliab., 2014)

Variability model for forming process in oxygen vacancy modulated high-κ based resistive switching memory devices. - Nagarajan Raghavan; Michel Bosman; Daniel D. Frey; Kin Leong Pey (Microelectron. Reliab., 2014)

Assessment of read disturb immunity in conducting bridge memory devices - A thermodynamic perspective. - Nagarajan Raghavan; Michel Bosman; Kin Leong Pey (Microelectron. Reliab., 2014)

Prognostic methodology for remaining useful life estimation of retention loss in nanoscale resistive switching memory. - Nagarajan Raghavan; Daniel D. Frey; Kin Leong Pey (Microelectron. Reliab., 2014)

High-κ dielectric breakdown in nanoscale logic devices - Scientific insight and technology impact. - Nagarajan Raghavan; Kin Leong Pey; Kalya Shubhakar (Microelectron. Reliab., 2014)

Impact of local structural and electrical properties of grain boundaries in polycrystalline HfO2 on reliability of SiOx interfacial layer. - Kalya Shubhakar; Nagarajan Raghavan; Sunil Singh Kushvaha; Michel Bosman; Zhongrui Wang; Sean J. O'Shea; Kin Leong Pey (Microelectron. Reliab., 2014)

Remaining useful life estimation for systems subject to multiple degradation mechanisms. - Nagarajan Raghavan; Daniel D. Frey (ICPHM, 2015)

Spectroscopy of SILC trap locations and spatial correlation study of percolation path in the high-κ and interfacial layer. - Nagarajan Raghavan; Michel Bosman; Kin Leong Pey (IRPS, 2015)

Monte Carlo model of reset stochastics and failure rate estimation of read disturb mechanism in HfOx RRAM. - Nagarajan Raghavan; Daniel D. Frey; Michel Bosman; Kin Leong Pey (IRPS, 2015)

Probabilistic insight to possibility of new metal filament nucleation during repeated cycling of conducting bridge memory. - Nagarajan Raghavan; Michel Bosman; Kin Leong Pey (Microelectron. Reliab., 2015)

Particle filter approach to lifetime prediction for microelectronic devices and systems with multiple failure mechanisms. - Nagarajan Raghavan; Daniel D. Frey (Microelectron. Reliab., 2015)

Statistics of retention failure in the low resistance state for hafnium oxide RRAM using a Kinetic Monte Carlo approach. - Nagarajan Raghavan; Daniel D. Frey; Michel Bosman; Kin Leong Pey (Microelectron. Reliab., 2015)

An SEM/STM based nanoprobing and TEM study of breakdown locations in HfO2/SiOx dielectric stacks for failure analysis. - Kalya Shubhakar; Michel Bosman; O. A. Neucheva; Y. C. Loke; Nagarajan Raghavan; R. Thamankar; Alok Ranjan 001; Sean J. O'Shea; Kin Leong Pey (Microelectron. Reliab., 2015)

Compliance current dominates evolution of NiSi2 defect size in Ni/dielectric/Si RRAM devices. - Sen Mei; Michel Bosman; Nagarajan Raghavan; Xing Wu 005; Kin Leong Pey (Microelectron. Reliab., 2016)

Application of the defect clustering model for forming, SET and RESET statistics in RRAM devices. - Nagarajan Raghavan (Microelectron. Reliab., 2016)

Analysis of quantum conductance, read disturb and switching statistics in HfO2 RRAM using conductive AFM. - Alok Ranjan 001; Nagarajan Raghavan; Joel Molina Reyes; Sean J. O'Shea; Kalya Shubhakar; Kin Leong Pey (Microelectron. Reliab., 2016)

Conductive filament formation at grain boundary locations in polycrystalline HfO2 -based MIM stacks: Computational and physical insight. - Kalya Shubhakar; Sen Mei; Michel Bosman; Nagarajan Raghavan; Alok Ranjan 001; Sean J. O'Shea; Kin Leong Pey (Microelectron. Reliab., 2016)

Uncertainty quantification in prognostics: A data driven polynomial chaos approach. - Pham Luu Trung Duong; Nagarajan Raghavan (ICPHM, 2017)

A metaheuristic approach to remaining useful life estimation of systems subject to multiple degradation mechanisms. - Pham Luu Trung Duong; Nagarajan Raghavan (ICPHM, 2017)

Application of multiplicative dimensional reduction method for uncertainty quantification and sensitivity analysis of MEMS electrostatic actuators. - Pham Luu Trung Duong; Trong Toan Tran; Nagarajan Raghavan (Microelectron. Reliab., 2017)

Uncertainty quantification in nanowire growth modeling - A precursor to quality semiconductor nanomanufacturing. - Chinedu I. Ossai; Xuechu Xu; Qing Yang 019; Nagarajan Raghavan (Microelectron. Reliab., 2017)

Area and pulsewidth dependence of bipolar TDDB in MgO magnetic tunnel junction. - Jia Hao Lim; Nagarajan Raghavan; Sen Mei; Vinayak Bharat Naik; Jae Hyun Kwon; S. M. Noh; B. Liu; E. H. Toh; Nyuk Leong Chung; Robin Chao; K. H. Lee; Kin Leong Pey (IRPS, 2018)

Mechanism of soft and hard breakdown in hexagonal boron nitride 2D dielectrics. - Alok Ranjan 001; Nagarajan Raghavan; Sean J. O'Shea; Sen Mei; Michel Bosman; Kalya Shubhakar; Kin Leong Pey (IRPS, 2018)

Application of expectation maximization and Kalman smoothing for prognosis of lumen maintenance life for light emitting diodes. - Pham Luu Trung Duong; Hyunseok Park; Nagarajan Raghavan (Microelectron. Reliab., 2018)

Application of multi-output Gaussian process regression for remaining useful life prediction of light emitting diodes. - Pham Luu Trung Duong; Hyunseok Park; Nagarajan Raghavan (Microelectron. Reliab., 2018)

Heuristic Kalman optimized particle filter for remaining useful life prediction of lithium-ion battery. - Pham Luu Trung Duong; Nagarajan Raghavan (Microelectron. Reliab., 2018)

Gaussian process regression approach for robust design and yield enhancement of self-assembled nanostructures. - Pham Luu Trung Duong; Xuechu Xu; Qing Yang 019; Nagarajan Raghavan (Microelectron. Reliab., 2018)

Statistical nature of hard breakdown recovery in high-κ dielectric stacks studied using ramped voltage stress. - Xuan Feng; Nagarajan Raghavan; Sen Mei; Shurong Dong; Kin Leong Pey; Hei Wong (Microelectron. Reliab., 2018)

A holistic comparison of the different resampling algorithms for particle filter based prognosis using lithium ion batteries as a case study. - Karkulali Pugalenthi; Nagarajan Raghavan (Microelectron. Reliab., 2018)

Comparison of experimental, analytical and simulation methods to estimate substrate material properties for warpage reliability analysis. - Cheryl Selvanayagam; Rathin Mandal; Nagarajan Raghavan (Microelectron. Reliab., 2018)

Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms. - Fernando Leonel Aguirre; Andrea Padovani; Alok Ranjan 001; Nagarajan Raghavan; Nahuel Vega; Nahuel Muller; Sebastián Matías Pazos; Mario Debray; Joel Molina Reyes; Kin Leong Pey; Felix Palumbo (IRPS, 2019)

Correct Extrapolation Model for TDDB of STT-MRAM MgO Magnetic Tunnel Junctions. - Jia Hao Lim; Nagarajan Raghavan; Vinayak Bharat Naik; Jae Hyun Kwon; Kazutaka Yamane; H. Yang; K. H. Lee; Kin Leong Pey (IRPS, 2019)

Dielectric Breakdown in 2D Layered Hexagonal Boron Nitride - The Knowns and the Unknowns. - Kin Leong Pey; Alok Ranjan 001; Nagarajan Raghavan; Kalya Shubhakar; Sean J. O'Shea (IRPS, 2019)

Correlation of Dielectric Breakdown and Nanoscale Adhesion in Silicon Dioxide Thin Films. - Alok Ranjan 001; Sean J. O'Shea; Michel Bosman; J. Molina; Nagarajan Raghavan; Kin Leong Pey (IRPS, 2020)

Origins and Signatures of Tail Bit Failures in Ultrathin MgO Based STT-MRAM. - Jia Hao Lim; Nagarajan Raghavan; Jae Hyun Kwon; Tae Young Lee; Robin Chao; Nyuk Leong Chung; Kazutaka Yamane; Naganivetha Thiyagarajah; Vinayak Bharat Naik; Kin Leong Pey (IRPS, 2020)

Reliability and Breakdown Study of Erase Gate Oxide in Split-Gate Non-Volatile Memory Device. - Laiqiang Luo; Kalya Shubhakar; Sen Mei; Nagarajan Raghavan; Fan Zhang; Danny Shum; Kin Leong Pey (IRPS, 2020)

Data Driven Prognosis of Fracture Dynamics Using Tensor Train and Gaussian Process Regression. - Pham Luu Trung Duong; Shaista Hussain; Mark Hyunpong Jhon; Nagarajan Raghavan (IEEE Access, 2020)

A Novel Framework for Semiconductor Manufacturing Final Test Yield Classification Using Machine Learning Techniques. - Dan Jiang; Weihua Lin; Nagarajan Raghavan (IEEE Access, 2020)

Piecewise Model-Based Online Prognosis of Lithium-Ion Batteries Using Particle Filters. - Karkulali Pugalenthi; Hyunseok Park; Nagarajan Raghavan (IEEE Access, 2020)

Learning Localized Spatial Material Properties of Substrates in Ultra-Thin Packages Using Markov Chain Monte Carlo and Finite Element Analysis. - Cheryl Selvanayagam; Pham Luu Trung Duong; Nagarajan Raghavan (IEEE Access, 2020)

Lubricating Oil Remaining Useful Life Prediction Using Multi-Output Gaussian Process Regression. - Monika Tanwar; Nagarajan Raghavan (IEEE Access, 2020)

Condition Based Maintenance Policy for Crankcase Lubricating Oil in Diesel Locomotives. - Monika Tanwar; Nagarajan Raghavan; Sidra Khanam (IEEM, 2021)

Bias Suppression Framework for Detrending Mean of Multi-Output Gaussian Process Regression in LED Remaining Storage Life Prognosis. - Lim Sze Li Harry; Pham Luu Trung Duong; Hyunseok Park; Nagarajan Raghavan (IEEE Access, 2021)

A Gaussian Mixture Model Clustering Ensemble Regressor for Semiconductor Manufacturing Final Test Yield Prediction. - Dan Jiang; Weihua Lin; Nagarajan Raghavan (IEEE Access, 2021)

Semiconductor Manufacturing Final Test Yield Optimization and Wafer Acceptance Test Parameter Inverse Design Using Multi-Objective Optimization Algorithms. - Dan Jiang; Weihua Lin; Nagarajan Raghavan (IEEE Access, 2021)

Developmental Trajectories in Blockchain Technology Using Patent-Based Knowledge Network Analysis. - Sohee Kim; Sejun Yoon; Nagarajan Raghavan; Nguyen-Truong Le; Hyunseok Park (IEEE Access, 2021)

Computational Failure Analysis of In-Memory RRAM Architecture for Pattern Classification CNN Circuits. - Nagaraj Lakshmana Prabhu; Nagarajan Raghavan (IEEE Access, 2021)

Hybrid Particle Filter Trained Neural Network for Prognosis of Lithium-Ion Batteries. - Karkulali Pugalenthi; Hyunseok Park; Shaista Hussain; Nagarajan Raghavan (IEEE Access, 2021)

Predicting Lumen Degradation of Light Emitting Diodes Using Hybrid Particle Filter Trained Neural Networks. - Karkulali Pugalenthi; Hyunseok Park; Shaista Hussain; Nagarajan Raghavan (IEEE Access, 2021)

Inverse Design for Low Warpage Ultra-Thin Packages Using Constrained Particle Swarm Optimization. - Cheryl Selvanayagam; Pham Luu Trung Duong; Brett Wilkerson; Nagarajan Raghavan (IEEE Access, 2021)

Hierarchical main path analysis to identify decompositional multi-knowledge trajectories. - Sejun Yoon; Changbae Mun; Nagarajan Raghavan; Dongwook Hwang; Sohee Kim; Hyunseok Park (J. Knowl. Manag., 2021)

Neuromorphic In-Memory RRAM NAND/NOR Circuit Performance Analysis in a CNN Training Framework on the Edge for Low Power IoT. - Nagaraj Lakshmana Prabhu; Nagarajan Raghavan (IEEE Access, 2022)

Global Optimization of Surface Warpage for Inverse Design of Ultra-Thin Electronic Packages Using Tensor Train Decomposition. - Cheryl Selvanayagam; Pham Luu Trung Duong; Brett Wilkerson; Nagarajan Raghavan (IEEE Access, 2022)

Remaining Useful Life Prediction of Lithium-Ion Batteries Using Neural Networks with Adaptive Bayesian Learning. - Karkulali Pugalenthi; Hyunseok Park; Shaista Hussain; Nagarajan Raghavan (Sensors, 2022)

Backhopping-based STT-MRAM Poisson Spiking Neuron for Neuromorphic Computation. - J. Tan; J. H. Lim; Jae Hyun Kwon; Vinayak Bharat Naik; Nagarajan Raghavan; Kin Leong Pey (IRPS, 2023)

A New Methodology to Precisely Induce Wake-Up for Reliability Assessment of Ferroelectric Devices. - Tiang Teck Tan; Yu-Yun Wang; Joel Tan; Tian-Li Wu; Nagarajan Raghavan; Kin Leong Pey (IRPS, 2023)

Investigating Knowledge Structure and Future Directions in IT-Based Business Methods Using Hierarchical Main Path Approach. - Sejun Yoon; Nagarajan Raghavan; Nguyen-Truong Le; Hyunseok Park (IEEE Access, 2023)

Development of a surrogate model for high-fidelity laser powder-bed fusion using tensor train and gaussian process regression. - Umesh Kizhakkinan; Pham Luu Trung Duong; Robert Laskowski; Guglielmo Vastola; David W. Rosen; Nagarajan Raghavan (J. Intell. Manuf., 2023)

Feature-Driven Density Prediction of Maraging Steel Additively Manufactured Samples Using Pyrometer Sensor and Supervised Machine Learning. - Rajesh Kumar Balaraman; Shaista Hussain; John Kgee Ong; Qing Yang Tan; Nagarajan Raghavan (IEEE Access, 2024)

Successive Multi-Stage Compliance-Ramp Voltage Sweep Methodology (MSC-RVS) for Understanding the Evolution of Gate Breakdown Mechanisms in p-GaN HEMTs. - Jerry Joseph James; Nagarajan Raghavan (IEEE Access, 2024)

Memristive Nanowire Network for Energy Efficient Audio Classification: Pre-Processing-Free Reservoir Computing with Reduced Latency. - Akshaya Rajesh; Pavithra Ananthasubramanian; Nagarajan Raghavan; Ankush Kumar (CoRR, 2024)

Second Life Prognostic for Li-Ion Battery: Cases of Missing Data with Polynomial Chaos and Time VAE. - Pham Luu Trung Duong; Nagarajan Raghavan (ICPHM, 2025)

Compound Fault Diagnosis for Train Transmission Systems Using Deep Learning with Fourier-enhanced Representation. - Jonathan Adam Rico; Nagarajan Raghavan; Senthilnath Jayavelu (ICPHM, 2025)

Lithium-ion Battery Capacity Loss Predictions using Domain-Knowledge-Incorporated Capacity Loss Model through Bayesian Inference. - Rahul Sahay; Hyunseok Park; Nagarajan Raghavan (ICPHM, 2025)