An Operationally Efficient Scheme for Exhaustive Test-Pattern Generation Using Linear Codes. - Nagesh Vasanthavada; Peter N. Marinos (ITC, 1985)

Testing of Fault-Tolerant Clock Systems. - Nagesh Vasanthavada; Peter N. Marinos; Gerald S. Mersten (ITC, 1986)

A monolithic scan-line bit producer for real-time image rasterization. - Nick Kanopoulos; Nagesh Vasanthavada (Microprocess. Microprogramming, 1987)

CAD Tools for Supporting System Design for Testability. - Jill J. Hallenbeck; Nick Kanopoulos; Nagesh Vasanthavada; James W. Watterson (ITC, 1988)

Synchronization of Fault-Tolerant Clocks in the Presence of Malicious Failures. - Nagesh Vasanthavada; Peter N. Marinos (IEEE Trans. Computers, 1988)

Design of an image edge detection filter using the Sobel operator. - Nick Kanopoulos; Nagesh Vasanthavada; Robert L. Baker 003 (IEEE J. Solid State Circuits, 1988)

Design of fault-tolerant clocks with realistic failure assumptions. - Nagesh Vasanthavada; Philip Thambidurai; Peter N. Marinos (FTCS, 1989)

The Test Engineer's Assistant: A Support Environment for Hardware Design for Testability. - Jill J. Hallenbeck; James R. Cybrynski; Nick Kanopoulos; Tassos Markas; Nagesh Vasanthavada (Computer, 1989)

A built-in test module for fault isolation. - Nagesh Vasanthavada; Nick Kanopoulos (IEEE Des. Test, 1989)

Testing of differential cascade voltage switch (DCVS) circuits. - Nick Kanopoulos; Nagesh Vasanthavada (IEEE J. Solid State Circuits, 1990)