Defect-Assisted Safe Operating Area Limits and High Current Failure in Graphene FETs. - Nagothu Karmel Kranthi; Abhishek Mishra; Adil Meersha; Harsha B. Variar; Mayank Shrivastava (IRPS, 2018)

On the ESD Reliability Issues in Carbon Electronics: Graphene and Carbon Nano Tubes. - Nagothu Karmel Kranthi; Abhishek Mishra; Adil Meersha; Mayank Shrivastava (VLSID, 2018)

Physical Insights into the Low Current ESD Failure of LDMOS-SCR and its Implication on Power Scalability. - Nagothu Karmel Kranthi; Boeila Sampath Kumar; Akram A. Salman; Gianluca Boselli; Mayank Shrivastava (IRPS, 2019)

Current Filament Dynamics Under ESD Stress in High Voltage (Bidirectional) SCRs and It's Implications on Power Law Behavior. - Nagothu Karmel Kranthi; Akram A. Salman; Gianluca Boselli; Mayank Shrivastava (IRPS, 2019)

First Demonstration and Physical Insights into Time-Dependent Breakdown of Graphene Channel and Interconnects. - Abhishek Mishra; Adil Meersha; Nagothu Karmel Kranthi; Kruti Trivedi; Harsha B. Variar; N. S. Veenadhari Bellamkonda; Srinivasan Raghavan 002; Mayank Shrivastava (IRPS, 2019)

How to Achieve Moving Current Filament in High Voltage LDMOS Devices: Physical Insights & Design Guidelines for Self-Protected Concepts. - Nagothu Karmel Kranthi; Chirag Garg; Boeila Sampath Kumar; Akram A. Salman; Gianluca Boselli; Mayank Shrivastava (IRPS, 2020)

Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices. - Nagothu Karmel Kranthi; Boeila Sampath Kumar; Akram A. Salman; Gianluca Boselli; Mayank Shrivastava (IRPS, 2020)

Effect of Source & Drain Side Abutting on the Low Current Filamentation in LDMOS-SCR Devices. - M. Monishmurali; Nagothu Karmel Kranthi; Gianluca Boselli; Mayank Shrivastava (IRPS, 2022)

Current Scalability Issues in Multi-Bank 5V PMOS ESD structures: Root cause and Design Guideline. - Nagothu Karmel Kranthi; Yang Xiu; Yang Xiao; Rajkumar Sankaralingam (IRPS, 2023)

Impact of Thin-oxide Gate on the On-Resistance of HV-PNP Under ESD Stress. - M. Monishmurali; Nagothu Karmel Kranthi; Gianluca Boselli; Mayank Shrivastava (IRPS, 2023)