Diagnose of radiation induced single event effects in a PLL using a heavy ion microbeam. - Santiago Martin Sondón; Alfredo Falcon; Pablo Sergio Mandolesi; Pedro Julián; Nahuel Vega; Francisco Nesprias; Jorge Davidson; Felix Palumbo; Mario Debray (LATW, 2013)

Heavy Ion Microbeam Experimental Study of ASET on a Full-Custom CMOS OpAmp. - Andrés Fontana; Sebastián Matías Pazos; Fernando L. Aguirre; Felix Palumbo; Nahuel Vega; Nahuel A. Müller; Emanuel de la Fourniere; Mario Debray (SBCCI, 2018)

Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms. - Fernando Leonel Aguirre; Andrea Padovani; Alok Ranjan 001; Nagarajan Raghavan; Nahuel Vega; Nahuel Muller; Sebastián Matías Pazos; Mario Debray; Joel Molina Reyes; Kin Leong Pey; Felix Palumbo (IRPS, 2019)