Performance properties in thick film silicate dielectric layers using molecular modeling. - Nancy Iwamoto; Ahila Krishnamoorthy; Richard Spear (Microelectron. Reliab., 2009)

Modeling mechanical properties of an epoxy using particle dynamics, as parameterized through molecular modeling. - Nancy Iwamoto (Microelectron. Reliab., 2011)

Developing the stress-strain curve to failure using mesoscale models parameterized from molecular models. - Nancy Iwamoto (Microelectron. Reliab., 2012)

Molecularly derived mesoscale modeling of an epoxy/Cu interface: Interface roughness. - Nancy Iwamoto (Microelectron. Reliab., 2013)