SoC Time to Market Improvement through Device Driver Reuse: An Industrial Experience. - Rohit Srivastava; Nandini Mudgil; Gaurav Gupta; Hemanta Mondal (ISED, 2012)

Automatic Test Bench Generation and Connection in Modern Verification Environments: Methodology and Tool. - Rohit Srivastava; Gaurav Gupta; Sarvesh Patankar; Nandini Mudgil (VDAT, 2013)