Distributionally Robust Circuit Design Optimization under Variation Shifts. - Yifan Pan; Zichang He; Nanlin Guo; Zheng Zhang 005 (ICCAD, 2023)

Efficient Statistical Parameter Extraction for Modeling MOSFET Mismatch. - Kun Wu; Nanlin Guo; Fei Li; Nengyong Zhu; Jun Tao 001; Xin Li 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023)

Yield Optimization for Analog Circuits over Multiple Corners via Bayesian Neural Networks: Enhancing Circuit Reliability under Environmental Variation. - Nanlin Guo; Fulin Peng; Jiahe Shi; Fan Yang 001; Jun Tao 001; Xuan Zeng 001 (ACM Trans. Design Autom. Electr. Syst., 2024)

Robust analog/RF circuit design via Cycle-Consistent Generative Adversarial Networks. - Nanlin Guo; Jun Tao 001; Xuan Zeng 001; Xin Li 001 (Integr., 2025)