Design of a one-transistor-cell multiple-valued CAM. - Takahiro Hanyu; Naoki Kanagawa; Michitaka Kameyama (IEEE J. Solid State Circuits, 1996)

Verification and synthesis for failure diagnosis of discrete event systems subject to permanent sensor failures. - Naoki Kanagawa; Shigemasa Takai (ETFA, 2014)

Diagnosability of discrete event systems subject to permanent sensor failures. - Naoki Kanagawa; Shigemasa Takai (Int. J. Control, 2015)