The Design of Totally Self-Checking Checkers for Classes of Hadamard Codes. - Naoki Wakita; Ken-ich Takagi; Yoshihiro Iwadare (FTCS, 1996)

HiSIM-RP: A reverse-profiling based 1st principles compact MOSFET model and its application to variability analysis of 90nm and 40nm CMOS. - Hironori Sakamoto; Shigetaka Kumashiro; Shigeo Sato; Naoki Wakita; Tohru Mogami (ISQED, 2012)