Multi-Step Stress Test for Yield Improvement of 16Mbit EPROMs with Redundancy Scheme. - Jun-ichi Miyamoto; Nobuaki Ohtsuka; Ken-ichi Imamiya; Naoto Tomita; Yumiko Iyama (ITC, 1991)

A 62-ns 16-Mb CMOS EPROM with voltage stress relaxation technique. - Naoto Tomita; Nobuaki Ohtsuka; Jun-ichi Miyamoto; Ken-ichi Imamiya; Yumiko Iyama; Seiichi Mori; Yoichi Ohshima; Norihisa Arai; Yukio Kaneko; Eiji Sakagami; Kuniyoshi Yoshikawa; Sumio Tanaka (IEEE J. Solid State Circuits, 1991)

Optimum redundancy design for new-generation EPROMs based on yield analysis of previous generation. - Ken-ichi Imamiya; Jun-ichi Miyamoto; Nobuaki Ohtuska; Naoto Tomita; Yumiko Iyama (VTS, 1992)

Fabrication of an E-Textile Bioelectrode Array With Screen-Printed Wiring and an Ionic Liquid Gel Toward Cutaneous Whole-Body Electromyography. - Naoto Tomita; Seiichi Takamatsu; Toshihiro Itoh (IEEE Access, 2023)

Wearable EMG Measurement Device Using Polyurethane Foam for Motion Artifact Suppression. - Takuma Takagi; Naoto Tomita; Suguru Sato; Michitaka Yamamoto; Seiichi Takamatsu; Toshihiro Itoh (Sensors, 2024)