Measurements and simulation of substrate noise coupling in RF ICs with CMOS digital noise emulator. - Naoya Azuma; Shunsuke Shimazaki; Noriyuki Miura; Makoto Nagata; Tomomitsu Kitamura; Satoru Takahashi; Motoki Murakami; Kazuaki Hori; Atsushi Nakamura; Kenta Tsukamoto; Mizuki Iwanami; Eiji Hankui; et al. (EMC Compo, 2013)

In-band spurious attenuation in LTE-class RFIC chip using a soft magnetic thin film. - Sho Muroga; Y. Shimada; Yasushi Endo; Satoshi Tanaka; Masahiro Yamaguchi; Naoya Azuma; Makoto Nagata; Motoki Murakami; Kazuaki Hori; Satoru Takahashi (EMC Compo, 2013)

Measurement-based diagnosis of wireless communication performance in the presence of in-band interferers in RF ICs. - Makoto Nagata; Shunsuke Shimazaki; Naoya Azuma; Satoru Takahashi; Motoki Murakami; Kazuaki Hori; Satoshi Tanaka; Masahiro Yamaguchi (EMC Compo, 2013)

In-system diagnosis of RF ICs for tolerance against on-chip in-band interferers. - Naoya Azuma; T. Makita; S. Ueyama; Makoto Nagata; Satoru Takahashi; Motoki Murakami; Kazuaki Hori; Satoshi Tanaka; Masahiro Yamaguchi (ITC, 2013)

Equivalent Circuit Representation of Silicon Substrate Coupling of Passive and Active RF Components. - Naoya Azuma; Makoto Nagata (IEICE Trans. Electron., 2013)

Chip Level Simulation of Substrate Noise Coupling and Interference in RF ICs with CMOS Digital Noise Emulator. - Naoya Azuma; Shunsuke Shimazaki; Noriyuki Miura; Makoto Nagata; Tomomitsu Kitamura; Satoru Takahashi; Motoki Murakami; Kazuaki Hori; Atsushi Nakamura; Kenta Tsukamoto; Mizuki Iwanami; Eiji Hankui; et al. (IEICE Trans. Electron., 2014)