Verification of the Injection Enhancement Effect in IGBTs by Measuring the Electron and Hole Currents Separately. - Takuya Hoshii; Kazuyoshi Furukawa; Kuniyuki Kakushima; Masahiro Watanabe; Naoyuki Shigvo; Takuya Saraya; Toshihiko Takakura; Kazuo Itou; Munetoshi Fukui; Shinichi Suzuki; Kiyoshi Takeuchi; Iriya Muneta; et al. (ESSDERC, 2018)