Influence of Fringing-Field on DC/AC Characteristics of Si₁₋ₓGeₓ Based Multi-Channel Tunnel FETs. - Narasimhulu Thoti; Yiming Li 005 (IEEE Access, 2020)

Device-Simulation-Based Machine Learning Technique for the Characteristic of Line Tunnel Field-Effect Transistors. - Chandni Akbar; Yiming Li 005; Narasimhulu Thoti (IEEE Access, 2022)