Influence of supply voltage on the multi-cell upset soft error sensitivity of dual- and triple-well 28 nm CMOS SRAMs. - Balaji Narasimham; Jung K. Wang; Narayana Vedula; Saket Gupta; Brandon Bartz; Carl Monzel; Indranil Chatterjee; Bharat L. Bhuva; Ronald D. Schrimpf; Robert A. Reed (IRPS, 2015)