A Split Driver Approach to Soc Virtualization - Challenges and Opportunities. - Venkatraghavan Srinivasan; Narendra Parihar; Vivek Khurana; Ada Gavrilovska (ICPP Workshops, 2010)

Aging-aware voltage scaling. - Victor M. van Santen; Hussam Amrouch; Narendra Parihar; Souvik Mahapatra; Jörg Henkel (DATE, 2016)

Analysis and Modeling of Stress over Layer Induced Threshold Voltage Shift in HKMG nMOS Transistors. - Apoorva Ojha; Narendra Parihar; Nihar R. Mohapatra (VLSID, 2016)

Key parameters driving transistor degradation in advanced strained SiGe channels. - Vincent Huard; Cheikh Ndiaye; M. Arabi; Narendra Parihar; X. Federspiel; Souhir Mhira; S. Mahapatra; Alain Bravaix (IRPS, 2018)

Prediction of NBTI stress and recovery time kinetics in Si capped SiGe p-MOSFETs. - Narendra Parihar; Souvik Mahapatra (IRPS, 2018)

A review of NBTI mechanisms and models. - Souvik Mahapatra; Narendra Parihar (Microelectron. Reliab., 2018)

On the Frequency Dependence of Bulk Trap Generation During AC Stress in Si and SiGe RMG P-FinFETs. - Narendra Parihar; Uma Sharma; Richard G. Southwick; Miaomiao Wang 006; James H. Stathis; Souvik Mahapatra (IRPS, 2019)

Modeling the Interdependences Between Voltage Fluctuation and BTI Aging. - Sami Salamin; Victor M. van Santen; Hussam Amrouch; Narendra Parihar; Souvik Mahapatra; Jörg Henkel (IEEE Trans. Very Large Scale Integr. Syst., 2019)

Analysis of The Hole Trapping Detrapping Component of NBTI Over Extended Temperature Range. - Nilotpal Choudhury; Narendra Parihar; Souvik Mahapatra (IRPS, 2020)

The Voltage Dependence of NBTI: Resolution of Controversy Surrounding Power Law vs. Exponential. - Narendra Parihar; Elias Frantz; Misagh Rostami-asrabad; Stephen M. Ramey (IRPS, 2025)