Dynamic Test Emulation for EDA-Based Mixed-Signal Test Development Automation. - Jean Qincui Xia; Tom Austin; Nash Khouzam (ITC, 1995)

Test time reduction of successive approximation register A/D converter by selective code measurement. - Shalabh Goyal; Abhijit Chatterjee; Mike Atia; Howard Iglehart; Chung Yu Chen; Bassem Shenouda; Nash Khouzam; Hosam Haggag (ITC, 2005)

Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. - Byoungho Kim; Nash Khouzam; Jacob A. Abraham (VTS, 2008)