Interpretable Anomaly Detection for Knowledge Discovery in Semiconductor Manufacturing. - Mattia Carletti; Marco Maggipinto; Alessandro Beghi; Gian Antonio Susto; Natalie Gentner; Yao Yang; Andreas Kyek (WSC, 2020)

Enhancing Scalability of Virtual Metrology: A Deep Learning-Based Approach for Domain Adaptation. - Natalie Gentner; Andreas Kyek; Yao Yang; Mattia Carletti; Gian Antonio Susto (WSC, 2020)

A Scalable Deep Learning-Based Approach for Anomaly Detection in Semiconductor Manufacturing. - Simone Tedesco; Gian Antonio Susto; Natalie Gentner; Andreas Kyek; Yao Yang (WSC, 2021)

Predictive Maintenance in the Industry: A Comparative Study on Deep Learning-based Remaining Useful Life Estimation. - Luciano Lorenti; Davide Dalle Pezze; Jacopo Andreoli; Chiara Masiero; Natalie Gentner; Yao Yang; Gian Antonio Susto (INDIN, 2023)

Enhancing Predictive Analytics in Semiconductor Manufacturing: A Deep Learning Approach for Overall Equipment Efficiency Estimation. - Filippo Boni; Riccardo De Monte; Yao Yang; Natalie Gentner; Joon Khim Low; Gian Antonio Susto (CoDIT, 2024)

Heterogeneous domain adaptation and equipment matching: DANN-based Alignment with Cyclic Supervision (DBACS). - Natalie Gentner; Gian Antonio Susto (Comput. Ind. Eng., 2024)

Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing. - Adrian Poniatowski; Natalie Gentner; Manuel Barusco; Davide Dalle Pezze; Samuele Salti; Gian Antonio Susto (CoRR, 2025)