Characterization of the gate-voltage dependency of input capacitance in a SiC MOSFET. - Nathabhat Phankong; Tsuyoshi Funaki; Takashi Hikihara (IEICE Electron. Express, 2010)

Switching characteristics of lateral-type and vertical-type SiC JFETs depending on their internal parasitic capacitances. - Nathabhat Phankong; Tsuyoshi Funaki; Takashi Hikihara (IEICE Electron. Express, 2010)