Injection Mechanisms and Lifetime Prediction with the Substrate Voltage in 0.15mum Channel-Length N-MOSFETs. - Alain Bravaix; Didier Goguenheim; Nathalie Revil; E. Vincent (Microelectron. Reliab., 2001)

Hot-Carrier Reliability for Si and SiGe HBTs: Aging Procedure, Extrapolation Model Limitations and Applications. - Nathalie Revil; Xavier Garros (Microelectron. Reliab., 2001)

Carrier injection efficiency for the reliability study of 3.5-1.2 nm thick gate-oxide CMOS technologies. - Alain Bravaix; C. Trapes; Didier Goguenheim; Nathalie Revil; E. Vincent (Microelectron. Reliab., 2003)

Hole injection enhanced hot-carrier degradation in PMOSFETs used for systems on chip applications with 6.5-2 nm thick gate-oxides. - Alain Bravaix; Didier Goguenheim; Nathalie Revil; E. Vincent (Microelectron. Reliab., 2004)

Impacts of the recovery phenomena on the worst-case of damage in DC/AC stressed ultra-thin NO gate-oxide MOSFETs. - Alain Bravaix; Didier Goguenheim; Mickael Denais; Vincent Huard; C. R. Parthasarathy; F. Perrier; Nathalie Revil; E. Vincent (Microelectron. Reliab., 2005)

A thorough investigation of MOSFETs NBTI degradation. - Vincent Huard; Mickael Denais; F. Perrier; Nathalie Revil; C. R. Parthasarathy; Alain Bravaix; E. Vincent (Microelectron. Reliab., 2005)

Impact of inside spacer process on fully self-aligned 250 GHz SiGe: C HBTs reliability performances: a-Si vs. nitride. - Malick Diop; Nathalie Revil; M. Marin; Frederic Monsieur; Pascal Chevalier 002; Gérard Ghibaudo (Microelectron. Reliab., 2008)

0.13µm SiGe BiCMOS Technology Fully Dedicated to mm-Wave Applications. - Grégory Avenier; Malick Diop; Pascal Chevalier 002; Germaine Troillard; Nicolas Loubet; Julien Bouvier; Linda Depoyan; Nicolas Derrier; Michel Buczko; Cédric Leyris; Samuel Boret; Sébastien Montusclat; et al. (IEEE J. Solid State Circuits, 2009)

A Methodology to Address RF Aging of 40nm CMOS PA Cells Under 5G mmW Modulation Profiles. - A. Divay; Cédric Dehos; Ismael Charlet; Fred Gaillard; B. Duriez; Xavier Garros; J. Antonijevic; Joycelyn Hai; Nathalie Revil; Jeremie Forest; Vincent Knopik; Florian Cacho; et al. (IRPS, 2024)