Characterization and reliability of III-V gate-all-around MOSFETs. - Mengwei Si; SangHoon Shin; Nathan J. Conrad; Jiangjiang Gu; Jingyun Zhang; Muhammad Ashraful Alam; Peide D. Ye (IRPS, 2015)

Integrated Implantable Electrode Array and Amplifier Design for Single-chip Wireless Neural Recordings. - Hengying Shan; Nathan J. Conrad; Shabnam Ghotbi; John Peterson; Saeed Mohammadi (ISQED, 2020)

Validating Supply Chain against Recycled COTS ICs using I/O Pad Transistors: A Zero-Area Intrinsic Odometer Approach. - Md. Asaduz Zaman Mamun; Nathan J. Conrad; Saeed Mohammadi; Muhammad Ashraful Alam (IRPS, 2024)