Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction. - Nathan Kupp; Petros Drineas; Mustapha Slamani; Yiorgos Makris (ETS, 2008)

Experiences in Hardware Trojan Design and Implementation. - Yier Jin; Nathan Kupp; Yiorgos Makris (HOST, 2009)

On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction. - Nathan Kupp; Petros Drineas; Mustapha Slamani; Yiorgos Makris (J. Electron. Test., 2009)

DFTT: Design for Trojan Test. - Yier Jin; Nathan Kupp; Yiorgos Makris (ICECS, 2010)

Post-production performance calibration in analog/RF devices. - Nathan Kupp; He Huang; Petros Drineas; Yiorgos Makris (ITC, 2010)

Correlating inline data with final test outcomes in analog/RF devices. - Nathan Kupp; Mustapha Slamani; Yiorgos Makris (DATE, 2011)

On proving the efficiency of alternative RF tests. - Nathan Kupp; Haralampos-G. D. Stratigopoulos; Petros Drineas; Yiorgos Makris (ICCAD, 2011)

Improving Analog and RF Device Yield through Performance Calibration. - Nathan Kupp; He Huang; Yiorgos Makris; Petros Drineas (IEEE Des. Test Comput., 2011)

Spatial correlation modeling for probe test cost reduction in RF devices. - Nathan Kupp; Ke Huang 001; John M. Carulli Jr.; Yiorgos Makris (ICCAD, 2012)

Spatial estimation of wafer measurement parameters using Gaussian process models. - Nathan Kupp; Ke Huang 001; John M. Carulli Jr.; Yiorgos Makris (ITC, 2012)

Integrated optimization of semiconductor manufacturing: A machine learning approach. - Nathan Kupp; Yiorgos Makris (ITC, 2012)

Towards a fully stand-alone analog/RF BIST: A cost-effective implementation of a neural classifier. - Dzmitry Maliuk; Nathan Kupp; Yiorgos Makris (VTS, 2012)

Applying the Model-View-Controller Paradigm to Adaptive Test. - Nathan Kupp; Yiorgos Makris (IEEE Des. Test Comput., 2012)

Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests. - Ke Huang 001; Nathan Kupp; John M. Carulli Jr.; Yiorgos Makris (DATE, 2013)

On combining alternate test with spatial correlation modeling in analog/RF ICs. - Ke Huang 001; Nathan Kupp; John M. Carulli Jr.; Yiorgos Makris (ETS, 2013)

Process monitoring through wafer-level spatial variation decomposition. - Ke Huang 001; Nathan Kupp; John M. Carulli Jr.; Yiorgos Makris (ITC, 2013)

Silicon Demonstration of Statistical Post-Production Tuning. - Yichuan Lu; Kiruba S. Subramani; He Huang; Nathan Kupp; Yiorgos Makris (ISVLSI, 2015)

A comparative study of one-shot statistical calibration methods for analog / RF ICs. - Yichuan Lu; Kiruba S. Subramani; He Huang; Nathan Kupp; Ke Huang 001; Yiorgos Makris (ITC, 2015)

Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models. - Ke Huang 001; Nathan Kupp; Constantinos Xanthopoulos; John M. Carulli Jr.; Yiorgos Makris (IEEE Des. Test, 2015)