Assessing Graph-based Deep Learning Models for Predicting Flash Point. - Xiaoyu Sun; Nathaniel J. Krakauer; Alexander Politowicz; Wei-Ting Chen; Qiying Li; Zuoyi Li; Xianjia Shao; Alfred Sunaryo; Mingren Shen; James Wang; Dane Morgan (CoRR, 2020)

Multi defect detection and analysis of electron microscopy images with deep learning. - Mingren Shen; Guanzhao Li; Dongxia Wu; Yuhan Liu; Jacob Greaves; Wei Hao; Nathaniel J. Krakauer; Leah Krudy; Jacob Perez; Varun Sreenivasan; Bryan Sanchez; Oigimer Torres; et al. (CoRR, 2021)