Analysis of Transient Negative Capacitance Characteristics for Stabilization and Amplification. - Nitanshu Chauhan; Govind Bajpai; Shashank Banchhor; Navjeet Bagga (VDAT, 2020)

Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET. - Aniket Gupta; Govind Bajpai; Priyanshi Singhal; Navjeet Bagga; Om Prakash 007; Shashank Banchhor; Hussam Amrouch; Nitanshu Chauhan (IRPS, 2021)

Cleaved-Gate Ferroelectric FET for Reliable Multi-Level Cell Storage. - Navjeet Bagga; Kai Ni 004; Nitanshu Chauhan; Om Prakash 007; X. Sharon Hu; Hussam Amrouch (IRPS, 2022)

Impact of Random Spatial Fluctuation in Non-Uniform Crystalline Phases on Multidomain MFIM Capacitor and Negative Capacitance FDSOI. - Nitanshu Chauhan; Chirag Garg; Kai Ni 004; Amit Kumar Behera; Sarita Yadav; Shashank Banchhor; Navjeet Bagga; Avirup Dasgupta; Arnab Datta; Sudeb Dasgupta; Anand Bulusu (IRPS, 2022)

Unveiling the Impact of Interface Traps Induced on Negative Capacitance Nanosheet FET: A Reliability Perspective. - Aniket Gupta; Govind Bajpai; Navjeet Bagga; Shashank Banchhor; Sudeb Dasgupta; Anand Bulusu; Nitanshu Chauhan (VDAT, 2022)

Impact of Temperature on NDR Characteristics of a Negative Capacitance FinFET: Role of Landau Parameter (α). - Rajeewa Kumar Jaisawal; Sunil Rathore; P. N. Kondekar; Navjeet Bagga (VDAT, 2022)

Substrate BOX engineering to mitigate the self-heating induced degradation in nanosheet transistor. - Sunil Rathore; Rajeewa Kumar Jaisawal; Navneet Gandhi; P. N. Kondekar; Navjeet Bagga (Microelectron. J., 2022)

Investigation of geometrical impact on a P+ buried negative capacitance SOI FET. - Toushik Santra; Ankit Dixit; Rajeewa Kumar Jaisawal; Sunil Rathore; Saheli Sarkhel; Navjeet Bagga (Microelectron. J., 2022)

Gate Oxide Induced Reliability Assessment of Junctionless FinFET-Based Hydrogen Gas Sensor. - Navneet Gandhi; Rajeewa Kumar Jaisawal; Sunil Rathore; P. N. Kondekar; Ankit Dixit; Naveen Kumar 014; Vihar P. Georgiev; Navjeet Bagga (SENSORS, 2023)

Self-Heating Aware Threshold Voltage Modulation Conforming to Process and Ambient Temperature Variation for Reliable Nanosheet FET. - Sunil Rathore; Rajeewa Kumar Jaisawal; P. N. Kondekar; Navneet Gandhi; Shashank Banchhor; Young Suh Song; Navjeet Bagga (IRPS, 2023)

Investigation of Analog/RF and linearity performance with self-heating effect in nanosheet FET. - Sunil Rathore; Rajeewa Kumar Jaisawal; Pravin Neminath Kondekar; Navjeet Bagga (Microelectron. J., 2023)

Small Signal Analysis of Nanosheet Transistor for sub-THz Frequency Considering Intersheet Capacitances and Modified Admittance Parameters. - Jyoti Patel; Navjeet Bagga; Vivek Kumar; S. Dasgupta (DRC, 2024)

Self-Heating and Process-Induced Threshold Voltage Aware Reliability and Aging Analysis of Forksheet FET. - Sunil Rathore; Navjeet Bagga; S. Dasgupta (IRPS, 2024)

Demonstration of a Vertically Stacked Junctionless Forksheet as Dielectric Modulated Biosensor. - Navneet Gandhi; Rajeewa Kumar Jaisawal; P. N. Kondekar; Ankit Dixit; Naveen Kumar 014; Vihar P. Georgiev; Navjeet Bagga (VDAT, 2024)