High Temperature and High Humidity Reliability Evaluation of Large-Area 1200V and 1700V SiC Diodes. - In-Hwan Ji; Anoop Mathew; Jae-Hyung Park; Neal Oldham; Matthew McCain; Shadi Sabri; Edward Van Brunt; Brett Hull; Daniel J. Lichtenwalner; Donald A. Gajewski; John W. Palmour (IRPS, 2023)