Effect of trench edge on pMOSFET reliability. - Yung-Huei Lee; Tom Linton; Ken Wu; Neal R. Mielke (Microelectron. Reliab., 2001)

The impact of PMOST bias-temperature degradation on logic circuit reliability performance. - Yung-Huei Lee; Steve Jacobs; Stefan Stadler; Neal R. Mielke; Ramez Nachman (Microelectron. Reliab., 2005)

Reliability of Solid-State Drives Based on NAND Flash Memory. - Neal R. Mielke; Robert E. Frickey; Ivan Kalastirsky; Minyan Quan; Dmitry Ustinov; Venkatesh J. Vasudevan (Proc. IEEE, 2017)